EDAX provides EDS, EBSD, WDS and Micro-XRF materials characterization solutions Contact Us - Visit the EDAX China website  Visit the EDAX Japan website

EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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EDAX Materials Characterization Product Offerings

Energy Dispersive Spectroscopy (EDS) 
EDAX’s EDS systems are used in conjunction with electron microscopes to determine the chemical elements present in materials at the microscopic level. The Element EDS System blends powerful elemental analysis routines with an intuitive, easy to use interface that ensures ideal data collection, analysis, and reporting for users of all levels. The Octane Elect and Octane Elite EDS Systems process EDS data at previously unachievable speeds. Smart Features in the software streamline analysis and facilitate workflow, while optimizing data quality and helping EDAX users solve their characterization problems quickly and more efficiently.
Energy Dispersive Spectroscopy (EDS)

Electron Backscatter Diffraction (EBSD) 
EDAX’s EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM. TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM to provide state of the art crystal structure characterization to all users. Smart Features in TEAM™ software streamline camera setup and facilitate workflow, while optimizing data quality and helping EDAX users solve their characterization problems quickly and more efficiently. The TEAM™ EBSD Analysis System is offered with the Hikari EBSD Camera Series and DigiView cameras.
Electron Backscatter Diffraction (EBSD)

Micro X-ray Fluorescence (Micro-XRF)
EDAX’s Orbis Micro-XRF System signifies a new generation of micro X-ray fluorescence systems. The X-ray sources, optics, and detectors are guaranteed to provide superior analytical results for a wide range of applications. Packed into a compact, tabletop design, the Orbis is one of the most versatile tools available for inorganic elemental analysis.
Micro X-ray Fluorescence (Micro-XRF)

Wavelength Dispersive Spectroscopy (WDS) 
EDAX’s WDS tools complement EDS analysis for light element work or where elemental overlaps cause serious problems. The TEAM™ WDS Analysis System is available with two spectrometers: the Low Energy X-ray Spectrometer (LEXS) and the Transition Element X-ray Spectrometer (TEXS).
Wavelength Dispersive Spectrometry (WDS)

X-ray Metrology
EDAX’s XLNCE X-ray Metrology products use non-destructive, X-ray Fluorescence (XRF) spectrometry to measure composition and film thickness of complex materials and multi-layer structures in quality assurance, process development and process control applications. The XLNCE X-ray Metrology products are designed to measure with speed and precision in challenging environments.

The XLNCE SMX-BEN XRF Analyzer is a benchtop unit capable of measuring solids, liquids and slurries. The XLNCE SMX-ILH XRF In-Line Analyzer is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates.
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Integrated Materials Characterization Tools 
The Pegasus Analysis System provides a means for complete characterization of materials by combining the elemental information from EDS and the structural information provided by EBSD. By combining these two powerful techniques the scientist can obtain unparalleled insight into the microstructure of today’s advanced materials. The unique ChI-Scan™ software, combines EDS and EBSD data to improve the accuracy of materials characterization.

The Neptune Analysis System provides seamless integration, combining the latest EDS detector technology with the next generation of WDS. Today’s material scientist often requires more in-depth analysis than EDS is capable of producing. The resolution of overlapping lines or lower detection limits are sometimes issues that need to be addressed using WDS.

The Trident Analysis System integrates all three microanalysis techniques, EDS, EBSD and WDS, for improved speed and accuracy of data processing and analysis.
Integrated Technologies
Integrated Technologies
Integrated Technologies


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