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EDAX Introduces New Silicon Drift Detectors for Octane Elite Series

Release Date: Thursday, July 21, 2016

MAHWAH, NJ - With the launch of two new detectors for its Octane Elite Silicon Drift Detector (SDD) Series, EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to take detector technology to the next level and offer analytical tools that deliver industry-leading results.

The Elite Plus and Elite Super detectors both include new, cutting-edge electronics and advanced sensor designs with multi-channel architecture that ensures the fastest acquisition rates, high collection efficiency and unmatched throughput levels and performance. They include the next generation of CMOS preamplifiers, based on widely praised CUBE technology, which offers low noise at high count rates. The SDD sensors are vacuum encapsulated and protected by a silicon nitride (Si3N4) window allowing for higher collection efficiency, increased light element sensitivity and improved resolution stability. The window is chemically inert and impermeable to moisture, which protects the sensor from contamination and condensation.

The Si3N4 window includes a honeycomb-shaped silicon support grid that allows it to be more transparent to X-rays. It can withstand daily plasma cleaning, ensuring high transmission properties for long-term applications, such as focused ion beam (FIB) or environmental Scanning Electron Microscopes (SEMs).

The new Octane Elite SDDs have a robust, ergonomic, enclosed modular design with a smaller environmental footprint without pinch points and include integrated automatic slides. They are paired with dedicated TEAM™ Analysis Software, including quantitative analysis with Fast Phase Mapping and dynamic Spectrum Library Match capabilities.

“The new Octane Elite SDD Series upholds the Octane legacy in high spectral resolution consistency at all count rates. It offers an unprecedented level of EDS performance that pushes the boundaries of microanalysis,”, comments Oleg Lourie, Senior EDS Product Manager at EDAX.

EDAX will introduce both the Elite Plus and the Elite Super at the Microscopy and Microanalysis 2016 Conference, July 25 to 28, in Columbus, OH, (Booth #1114). Please click here to schedule a demo at the booth.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $4.0 billion. For further information about EDAX, contact:

Sue Arnell
EDAX, Inc.
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
Email: sue.arnell@ametek.com
Website: www.edax.com

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