EDAX provides EDS, EBSD, WDS and Micro-XRF materials characterization solutions Contact Us - Visit the EDAX China website  Visit the EDAX Japan website

EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
Path: Home>Products>Micro-XRF>Orbis>Orbis Silicon Drift Detector (SDD) Analyzer
X-ray Metrology
Integrated Technologies
Click here to contact an EDAX associate.

Orbis Silicon Drift Detector (SDD) Analyzer

The standard Orbis analyzer is ideal for applications that require large-particle or large feature analysis. This would include criminal forensics or industrial quality control work. The instrument has an industry-leading LN-Free X-ray silicon drift detector (SDD) and a color video camera with 10x and 100x magnification. A 300 µm mono-capillary lens, primary beam filter system and standard-precision motorized XYZ stage, and Genesis DPP analyzer are also included.

Standard Orbis SDD components include:

  • Rh tube (50kV, 50 W)
  • 300 µm mono-capillary optic
  • Automated primary beam filter system (open position, 6 filters, shutter)
  • Dual CCD cameras: 10x color; 100x color
  • Advanced 30 mm2 Silicon Drift Detector (SDD). No liquid cryogen cooling required 
  • Standard precision, computer-controlled XYZ stage
  • Sample chamber: vacuum or air
  • Digital signal analyzer electronics
  • Operating SW with automated analysis and quantification routines including:
    • Fundamental Parameter analysis with or without standards
    • Trace element analysis in light element matrices using Fundamental Parameter analysis
    • Semi-empirical analysis using calibrations with standards
The EDAX Orbis Micro-XRF Silicon Drift Detector (SDD) Analyzer offers non-destructive elemental analysis
The Orbis design eliminates incorrect sample analysis that occurs when sample topography obstructs the X-ray beam.

  • Sample chamber viewport with 4.9" x 4.9" (124 mm x 124 mm) viewable area
  • Advanced 50 mm2 Silicon Drift Detector (SDD)
  • Mo tube (50kV, 50W)
  • 100 µm mono-capillary optic in lieu of 300 µm mono-capillary optic
  • Automated collimators (1 mm and 2 mm) in conjunction with mono-capillary optic; selectable by SW control 
  • Software: spectral mapping, image processing SW, linescan, coating analysis, spectral matching, alloy ID, remote spectrometer SW for data processing

Literature Downloads

Follow EDAX on
Join EDAX on LinkedIn Follow EDAX on Twitter @EDAXInc Follow EDAXBlog.com Join EDAX on YouTube 

Home - CareersContact Us 

© Copyright 2017 EDAX Inc. All Rights Reserved 

Privacy PolicyTrademarksTerms & Conditions - Sitemap - www.ametek.com