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EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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Orientation Imaging Microscopy (OIM) Analysis™

Orientation Imaging Microscopy (OIM™) v8  

The Most Powerful, Flexible, and Easy to Use Tool for the Visualization and Analysis of Electron Backscatter Diffraction (EBSD) Mapping Data

OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns. This mapping data provides information on the orientation, phase distribution, grain size and shape, grain boundary structure, and local deformation of crystallographic microstructures. OIM Analysis™ provides virtually unlimited potential for interrogating the wealth of information contained in OIM scans.

What's New in OIM Analysis™ v8?

With the addition of new functionality and features, OIM Analysis™ v8 has reset the standard for EBSD data analysis capability and enables users to achieve new insight into microstructural characterization. Click here to find out more about OIM Analysis™ v8.

OIM Analysis™ Standard Features

OIM™ Analysis offers a lot of features to give you the best EBSD analysis 

OIM Maps
OIM Maps provide colorful and meaningful graphics, which give a useful insight into material microstructures.

OIM Charts
OIM Charts show numerical representations of the measured microstructure with statistical information for easy comparisons.

OIM Plots
OIM Plots offer visualization of measured orientation and misorientation distributions.

QuickGen Toolbar
The QuickGen Toolbar is an intuitive starting point for analysis, offering quick access to commonly used maps, charts, and plots.

The OIM™ Analysis QuickGen Toolbar
OIM Analysis™ QuickGen Toolbar

OIM Templates
OIM Templates offer an easy-to-use tool for performing repetitive, customized analysis of OIM data.

Data Partitioning
Data Partitioning enables the splitting of OIM data into different microstructural subsets so that the different portions can be measured separately.

OIM™ Data Partitioning enables the splitting of OIM™ data into different microstructural subsets so that the different portions can be measured separately
OIM Data Partitioning

Data Highlighting
Data Highlighting enables the analyst to identify specific data ranges and microstructural features on maps and plots.

Interactive Analysis
Interactive Analysis allows the analyst to conduct a manual interrogation of data so that the information of interest can be extracted.

OIM Batch Processor
OIM Batch Processor enables the preparation and analysis of multiple datasets easily and consistently in a single action.

OIM™ Project Tree is an intuitive data management structure for novice and advanced users
OIM Project Tree

OIM Project Tree
OIM Project Tree is an intuitive data management structure for novice and advanced users.

OIM Analysis™ EBSD Indexing
Even the best analysis tools may generate initial low-quality data. However, OIM Analysis™ has the resources to evaluate data quality and to improve it using EBSD pattern reindexing.

Comprehensive Analysis
Comprehensive Analysis offers grouped functions for a wide range of focused analysis within an integrated analysis package.

  • Advanced Grain Analysis
  • Advanced Texture Analysis
  • Advanced Boundary Analysis
  • Advanced Materials Properties Analysis
  • Advanced Data Manipulation

OIM 3D Visualization
OIM Analysis™ extends comprehensive EBSD characterization into 3D EBSD.

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